The Paul Drude Award is named in honor of Paul Karl Ludwig Drude (1867 ­ 1906), who invented and first applied ellipsometry. Reflecting Drude’s oeuvre related to the electron-conductivity model, emphasis is also placed on spectroscopically determining and understanding the interaction of light with matter. The Paul Drude Award is presented by the Selection Committee Secretary at a ceremonial session of ICSE, followed by an invited presentation by the prizewinner. The Paul Drude Award is given to a young scientist for exceptional contributions to the development and application of spectroscopic ellipsometry. The Paul Drude Award is from then on given at each International Conference of Spectroscopic Ellipsometry (ICSE). The fourth conference (ICSE4) is held this year in Stockholm. The ICSE4 Paul Drude Award is sponsored by the J. A. Woollam Co., Inc., and includes a monetary prize of €1000.

Peter Petrik has delivered main contributions to the systematic improvement of optical models and their applicability in spectroscopic ellipsometry to make this technique better adaptable as a non-destructive, in-line characterization of semiconductor surfaces and near-surface layers. His research included the study of ion implanted semiconductors, porous silicon, high-k materials, poly- and nano-crystalline semiconductors. He has implemented the optical models for characterization and understanding of nucleation and growth of diamond films, ion implantation induced damage accumulation layers, surface roughness, ion implantation-caused damage surface and depth profiles, polysilicon formation, surface damage caused by plasma immersion ion implantation. He applied the ellipsometry technique to poly and single crystalline silicon, silicon carbide, helium implanted silicon and polysilicon on oxide, for example. Peter Petrik demonstrated that ellipsometry can deliver new insight into semiconductor surfaces and near-surface material properties. Peter Petrik demonstrated upon his achievements his present role as a leading scientist in the development and the application of spectroscopic ellipsometry.