Invited Speakers
Invited Speakers
- Ingemar Lundström, Linköping University, Sweden
ICSE-4 Opening, Title to be announced
- Manuel Cardona, Max-Planck Institut für Festkörperforschung, Germany
Plenary - "The Scientific Legacy of Paul Drude"
- Rasheed M. A. Azzam, University of New Orleans, U.S.A.
Plenary - "Polarization optics of interfaces and thin films"
- Robert W. Collins, The University of Toledo, U.S.A.
Plenary - "Multichannel ellipsometry for real time Stokes vector and Mueller matrix spectroscopies: current status and future perspectives"
- David E. Aspnes, North Carolina State University, U.S.A.
Plenary - "Spectroscopic Ellipsometry and Polarimetry: Status and Prospects"
- Alain C. Diebold, University at Albany, U.S.A.
Plenary - "Ellipsometry and NanoMetrology"
- Maria Losurdo, University of Bari, Italy
Plenary - "Spectroscopic Ellipsometry in the Semiconductor Materials World: Recent Achievements, Developments and Challenges"
- Christian Bernhard, Université Fribourg, Switzerland
"Infrared ellipsometry using a synchrotron light source"
- Vanya Darakchieva, Linköping University, Sweden
"Infrared generalized ellipsometry on non-polar and superlattice group-III nitride films: strain and phonon anisotropy"
- Tino Hofmann, University of Nebraska-Lincoln, U.S.A.
"Terahertz magnetooptic ellipsometry"
- Ian Hodgkinson, University of Otago, New Zealand
"Characterization of elliptically-polarizing natural and nanoengineered Bragg reflectors"
- Rüdiger Goldhahn, Technische Univerität Ilmenau, Germany
"Band structure and optical properties of group-III-Nitride materials"
- Karsten Hinrichs, Institute for Analytical Sciences, Department Berlin, Germany
"In situ infrared ellipsometry of thin films at liquid-solid interfaces"
- Gang Jin, Chinese Academy of Science, Center for Systems Biology, P. R. China
"Development of Biosensor based on Imaging Ellipsometry"
- Michael Rübhausen, Universität Hamburg, Germany
"Determination of the dielectric response of multiferroic manganites using generalized magneto-optical ellipsometry"
- Kevin Robbie, Queen's University, Canada
"Synthesis and analysis of nanostructured thin films"
- E. Langereis, Eindhoven University of Technology, The Netherlands
"Atomic layer deposition of conductive metal nitride films
monitored by in situ spectroscopic ellipsometry"
- Antonello de Martino, LPICM, Ecole Polytechnique Palaiseau, France
"Spectroscopic Mueller polarimetry in conical diffraction"
- Razvigor Ossikovski, LPICM, Ecole Polytechnique Palaiseau, France
"Depolarizing Mueller matrices: how to decompose them?"
- Peter Petrik, Research Institute for Technical Physics and Materials Science, Hungary
"Ellipsometric models for vertically inhomogeneous composite structures"
- Mariano Campoy-Quiles, Imperial College London, UK
"Ellipsometry and polymer semiconductors for OLEDs and OPVs: From delocalisation of excitons to molecular dynamics"
- M. Vaupel, Nanofilm Technologie GmbH, Germany
"n & k testing of magnetic heads with imaging spectroscopic ellipsometry"
- Leo Asinovski, Semiconsoft Inc., U.S.A.
"Imaging Ellipsometry: quantitative analysis"
- Herbert Wormeester, University of Twente, The Netherlands
"Optical response of particulate 2D films"
